Asset 2

HSD

Analog and Power Test System

HSD

HSD

Analog, Digital to Power Discrete

High Speed Digitizer Module for STS8200
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Key Features

  • Two analog channels and two external digital trigger channels
  • Bandwidth up to 200MHz
  • Sampling rate up to 1GSa/s
  • Sampling buffer memory is up to 500M
  • Automatic measurements

More Options

PFM

Picofarad Test Module

PAM

Pico-Ampere Current Test Module

MIPI Test Kit

Protocol Conversion Kit for STS8200

IPM Test Kit 2.0

IPM Test Kit for STS8200

HCM100

High Current Module for STS8200

GaN FET Test Kit 2.0

GaN Test Kit for STS8200

DOL

Dual_OP- AMP_Loop Test Module

QVM

Analog measurement resource for STS8200

QTMU_PLUS

Analog time measurement resource for STS8200

HVI1K

Floating High Voltage VI Source Measure Module for STS8200

FPVI10_PLUS

Floating Power Dual VI Source Measure Module for STS8200

FOVI100

Floating Octal VI Source Measure Module for STS8200

DIO3.0

Digital resource for STS8200

DIO2.0_PLUS

Digital resource for STS8200

CBIT128

Control Bit Module for STS8200

ACSM_PLUS

Analog AC Source and Meter for STS8200

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Copyright © 2025 Beijing Huafeng Test & Control Technology Co., Ltd. All rights reserved. 京ICP备09020255号-3