Analog and Power Test System
AXE-FET DC
AXE-FET DC
Analog Discrete and Wafer Test
DC parameter test module for STS8200 AXE-FET
Key Features
- Single board supports simultaneous testing of two die
- Supports high-voltage leakage testing for Drain, Source, and Gate terminals (supports up to 2000V)
- Supports Rdson testing with maximum current of ±160A (serial)
- Supports GFS testing with maximum current of ±10A
- Multi-Station Parallel Testing Mode: Supported
