System on Chip (SoC) Test System
STS8600
STS8600
System on Chip (SoC) Test System
Engineered for high-performance AI applications, it features advanced circuitry for SoC, FPGA, ADC, wireless connectivity, and chiplet integration, all supported by a liquid-cooled, ultra-modern next generation test head.
Designed to cater specifically to the stringent testing needs of Power Management ICs (PMICs). The STS8300 features a sophisticated and well-planned design that delivers the desired level of precision, stability, flexible configuration options, and an expandable architecture.
These attributes collectively positions the STS8300 as a superior choice in terms of cost performance in the ATE market.
Key Features
Maximum Voltage and Current Ratings:
- ±2000V/600A (DC Static)
- 100kHz-1Mhz ZMU (±40V DC Bias up to ±2000V option)
- Low leakage current range of ± 1nA
- Precision 18-bit voltmeter measurement
- IC resource digital capability
- 1200V/3000A dynamic test capabilities, hard or soft docking
Resources Specifications
FOVIe
8 channels floating V/I, with 4 channels per bank
±40V/±100mA DC, ±1A pulsed
4Kx16-Bit AWG, 200KSPS 4Kx16-Bit voltage and current digitizer per channel
FXVIe_Plus
12 channels floating V/I, with 6 channels per bank
Fan-out up to 16 channels
±40V/±100mA DC, ±40V/±1A pulsed
4Kx16-Bit AWG, 200KSPS 4Kx16-Bit voltage and current digitizer per channel
2 TMU channels per bank. Enables differential voltage measurement between any two channels within each bank
ACM200
8 channels floating V/I, with 4 channels per bank
±40V/±100mA DC, ±1A pulsed
200KSPS 4Kx16-Bit voltage and current digitizer per channel
ACM
24 channels V/I, 6 channels per bank
-2V to +18V/±200mA DC, ±500mA pulsed
4Kx16-Bit AWG, 200KSPS 4Kx16-Bit voltage or current digitizer per channel
FPVIe
2 channels full floating V/I
±100V/±200mA DC, ±40V pulsed up to ±10A
4Kx16-Bit AWG, 1MSPS 4Kx16-Bit voltage and current digitizer per channel
