Analog and Power Test System
STS8200 CROSS Series
STS8200
Analog, Digital to Power Discrete
Industry leading scalable semiconductor test platform
for small signal analog, digital hybrid devices to power discrete.
Comprehensive One Platform for Analog, Power Discrete and Power Modules
Modular expansion with CROSS platform capable utilising full floating IC test system VI resources.
Application Kits and Specific Functionality Advancement
Various production ready application drop-in kits and test heads serving explicit test functionalities and test methodologies.
Open Architecture Programming
Enables user specific test flow and methods with open architecture C++ programming of test resources.
Key Features
Maximum Voltage and Current Ratings:
- ±2000V/10A (DC Static)
- 100kHz-1MHz ZMU (±40V DC Bias up to ±2000V option)
- Low leakage current range of ± 1nA
- Precision 18-bit voltmeter measurement
- AC source up to 200kHz and measure up to ±100V
- IC resource digital capability
This system mainframe features 26 universal slots, serving as building blocks for testing Analog, Digital, PMIC, and Power Modules.
All AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics.
