System Feature:
- MOSFET Wafer Testing up to 16 sites，100v/10A per site test
- High voltage test option up to 1000V
- UIS test option up to 10A
- Others AC test option
System Features：
- Focus on power discrete device test as MOSFET，Schottky, IGBT
- 2000v/ 200A DC test capability
- UIS , DVDS and ZMU (Ciss/Coss/Crss/Rg) Test option
- Multi-function Test mode to support DC and AC item testing at same time interface with different test station
- Menu Driven Programming,
- Flexible expansion to Analog IC tester under “CROSS” mainframe
System Feature:
- GaN Test Kit based on AccoTEST Standard test platform STS8200 or STS8300
- Up to quad site test by one kit, and max. support 2 test kits with 8 sites test in parallel by the tester
- Fully Floating VI source driven up to 1000V/10A DC, max.2000v/20A
- Low leakage test module included,<1nA Leakage test ability
- Support menu-driven programming
Option for Dynamic Ron test
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+86-010-6372 5600
Fax：010-63725400
Address: Building 5, IC PARK,NO.9 Fenghao East Road ,
Haidian District,Beijing
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