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  ICON  Mar.15-17.2016,AccoTEST make good winning in SEMICON CHINA 2016 Date:3/25/2016

“High Pin Count PMIC Test Solution”
Mar. 15-17,2016 in Shanghai New International Expo Centre.
AccoTEST provided PMIC test solutions for more analog pins, more digital pins, higher accuracy
timing and more AC signal test requirements. At the same time AccoTEST showed the application for
Strip Test Solution and IPM Test Solution.

Mr. Dean VanDruff, director of marketing and sales in AccoTEST U.S.,

and Mr. Katsumoto Hayashi,director of marketing and sales in AccoTEST Japan participated in the exhibition.

IPM application case:



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